Combined NSOM/AFM systems operational in the field, apply with scientific applications – from biological to semiconductor, and from chemical through to telecommunications.
Advanced systems for low temperature NSOM/AFM; environmental chambers; chemical and gas delivery systems; and nano-lithography systems are all part of combined near-field optical microscopes.
Powerful imaging combinations such as combined AFM/NSOM/SEM and combined AFM/NSOM/micro-Raman systems, allow scientists unique experimental set-ups for ground breaking applications.
NSOM SNOM systems are for transmission, collection and true reflection. Systems both AFM and NSOM provide for a completely free optical axis from both above and below, thus allowing for transparent SPM integration with standard optical microscopes both upright, inverted and unique dual (or 4pi) microscopes.
The award winning MultiView 1000 is the first system available that fully integrates all forms of scanned probe microscopy with conventional optical microscopy.
Designed around Nanonics’ patented, award winning 3D Flatscan scanner technology and incorporating sophisticated cantilevered optical fiber probes, the instrument can simply and transparently be combined with any inverted, upright, or dual optical microscope.
Simultaneous NSOM/AFM/Confocal Imaging
Normal Force Sensing Open System Architecture -Transmission, Reflection, and Collection Modes
Modular and Customized Systems
Large 70 micron Z range
Integration with Complementary Techniques
Wide Range of Scanning Probes
Electrical and Thermal Measurements